Estimation of exciton diffusion lengths of organic semiconductors in random domains

Exciton diffusion length plays a vital role in the function of opto-electronic devices. Oftentimes, the domain occupied by an organic semiconductor is subject to surface measurement error and the result is found to be sensitive. We propose an asymptotic-based method as an approximate forward solver whose accuracy is justified both theoretically and numerically. It only requires to solve several deterministic problems over a fixed domain. We find that the correlation length of randomness is important to determine whether a 1D reduced model is a good surrogate.